• DocumentCode
    1546469
  • Title

    Electrical evaluation of flip-chip package alternatives for next generation microprocessors

  • Author

    Darnauer, Joel ; Chengson, Dave ; Schmidt, Bill ; Priest, Ed ; Hanson, David A. ; Petefish, William G.

  • Author_Institution
    Juniper Networks, Mountain View, CA, USA
  • Volume
    22
  • Issue
    3
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    407
  • Lastpage
    415
  • Abstract
    Two styles of flip-chip packages for next-generation microprocessors were designed: a low-cost organic ball-grid-array (BGA) and a thin-film-on-ceramic land-grid array (LGA). Simultaneous switching output (SSO) noise, and core noise were measured. Although SSO was improved by a factor of two over the previous generation of packaging, core noise was still quite significant. We found that core noise is best managed by placing low-inductance capacitance close to the noise source, i.e., using on-chip capacitors, coupled planes in the package, or on-package bypass capacitors. Because of the lower impedance of its power planes, the ceramic package showed significantly better electrical performance than the organic. Addition of on-package bypass capacitors greatly narrows the gap between the two packages
  • Keywords
    application specific integrated circuits; ball grid arrays; ceramic packaging; chip scale packaging; flip-chip devices; integrated circuit noise; laminates; microprocessor chips; plastic packaging; thin film circuits; ASIC; Gore Microlam BGA; IC packaging; ceramic package; circuit noise; core noise; coupled planes; electrical evaluation; flip-chip package alternatives; hybrid LGA; laminated packaging; low-cost organic BGA; low-inductance capacitance; next generation microprocessors; on-chip capacitors; on-package bypass capacitors; plastic packaging; simultaneous switching output noise; thin film circuit packaging; thin-film-on-ceramic LGA; time domain measurements; Bandwidth; Capacitors; Ceramics; Costs; Integrated circuit packaging; Microprocessors; Noise measurement; Plastic integrated circuit packaging; Testing; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.784494
  • Filename
    784494