Title :
A real-time electro-optic handy probe using a continuous-wave laser
Author :
Shinagawa, Mitsuru ; Nagatsurria, T. ; Ohno, Kazuhide ; Jin, Yoshito
Author_Institution :
NTT Telecommun. Energy Labs., Kanagawa, Japan
fDate :
10/1/2001 12:00:00 AM
Abstract :
This paper describes a real-time electro-optic (EO) probe system that can be directly connected to digital oscilloscopes, spectrum analyzers, and other widely used instruments. The probe incorporates a balanced optical receiver with two high-speed InGaAs p-i-n photodetectors (PDs) to reduce noise, and optical isolators to decrease the light reflected from the optics back to the laser diode (LD). To increase sensitivity, we employ cadmium telluride (CdTe), which has a large EO coefficient, and a high-power 1.3-μm distributed-feedback (DFB) LD as a continuous-wave (CW) laser source. We used it to measure eye diagrams at 1 Gb/s that were displayed on a digital oscilloscope. In addition, when connected to a spectrum analyzer, the probe significantly simplifies frequency-domain analysis. We demonstrate the measurement of electric nearfield distribution radiating from a two-layer printed circuit board (PCB) and a cellular phone. The result shows that the probe system is a potential candidate for electromagnetic interference (EMI) instruments
Keywords :
III-V semiconductors; automatic test equipment; cadmium compounds; computerised instrumentation; electric noise measurement; electro-optical devices; electromagnetic interference; frequency-domain analysis; gallium arsenide; indium compounds; measurement by laser beam; optical receivers; photodetectors; printed circuit testing; probes; real-time systems; telecommunication equipment testing; 1 Gb/s; 1 Gbit/s; 1.3 micrometre; CdTe; InGaAs; PCB; balanced optical receiver; cellular phone; continuous-wave laser source; digital oscilloscopes; distributed feedback laser diode; electric nearfield distribution; electromagnetic interference instruments; eye diagram; high-speed InGaAs photodetectors; optical isolators; real-time electro-optic probe; spectrum analyzers; two-layer printed circuit board; High speed optical techniques; Instruments; Laser noise; Lasers and electrooptics; Optical noise; Optical receivers; Optical sensors; Oscilloscopes; Probes; Spectral analysis;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on