DocumentCode :
1546594
Title :
Determination of electromechanical coupling factors of low Q piezoelectric resonators operating in stiffened modes
Author :
Emeterio, J. L San
Author_Institution :
Inst. de Acustica, CSIC, Madrid, Spain
Volume :
44
Issue :
1
fYear :
1997
Firstpage :
108
Lastpage :
113
Abstract :
The electromechanical coupling coefficient is usually determined from the relative spacing of the frequencies of resonance and antiresonance. The conventional formula is derived from equations describing the electrical behavior of an ideal piezoelectric resonator in the absence of losses. In this paper, the influence of the intrinsic material losses on the shift of the resonance/antiresonance frequencies, and therefore on the accuracy of the standard formula to determine k, is analyzed. The exact one-dimensional model of the piezoelectric resonator vibrating in a pure stiffened mode, with a rigorous account of the internal mechanical losses, has been taken as a reference, instead of the frequently used lumped approximate equivalent circuit (Butterworth-Van Dyke). It is shown that the coupling coefficient determined from the frequencies f/sub s/ and f/sub p/ is less than the intrinsic coupling coefficient, and that the error increases for highly attenuating materials with weak electromechanical coupling. The error due to the effect of attenuation, which increases with the decrease of the product Q/sub m/k of the resonator intrinsic parameters, has been systematically evaluated and plotted for 0.5\n\n\t\t
Keywords :
crystal resonators; antiresonance frequency; attenuation; electromechanical coupling factor; internal mechanical loss; low Q piezoelectric resonator; noniterative method; one-dimensional model; resonance frequency; stiffened mode; vibration; Coupling circuits; Dielectric losses; Dielectric materials; Equations; Equivalent circuits; Frequency; Impedance measurement; Iterative methods; Piezoelectric materials; Resonance;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.585203
Filename :
585203
Link To Document :
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