Automated test equipment for research on nonvolatile memories

Author

Pellati, Paolo ; Olivo, Piero

Author_Institution

Dipt. di Ingegneria, Ferrara Univ., Italy

Volume

50

Issue

5

fYear

2001

fDate

10/1/2001 12:00:00 AM

Firstpage

1162

Lastpage

1166

Abstract

This paper presents a measurement system for research on nonvolatile memories, such as flash, EPROM, EEPROM. The instrument architecture is based on the PCI local bus, thus allowing a direct interface of the memory under test with the PC controlling the measurement. A rank of programmable waveform generators allows applying arbitrary signals to the memory cells during writing and reading, thus guaranteeing the flexibility required at the research level. The instrument performances have been evaluated on 4 MB test chips and results are comparable to those of commercial automated test equipment (ATE). This instrument, besides the analysis of writing operations, can be successfully used to evaluate the evolution of such operations during memory cycling and their impact on long-term reliability

Keywords

EPROM; automatic test equipment; field buses; integrated circuit reliability; integrated circuit testing; integrated memory circuits; waveform generators; 4 MB; ATE; EEPROAL; EPROM; IC reliability; PC control; PCI local bus; automated test equipment; data acquisition; flash memories; integrated memory testing; long-term reliability; measurement system; memory cycling; nonvolatile memories; programmable waveform generators; writing operations; Automatic control; EPROM; Instruments; Nonvolatile memory; Read-write memory; Semiconductor device measurement; Signal generators; Test equipment; Testing; Writing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.963177

Filename

963177