Title :
Equivalence Between Direct and Synthetic Short-Circuit Interruption Tests on HV Circuit Breakers
Author :
St-Jean, Guy ; Wang, Ren Fu
Author_Institution :
IREQ, Varennes, PQ, Canada
fDate :
7/1/1983 12:00:00 AM
Keywords :
Breakdown voltage; Capacitors; Circuit breakers; Circuit testing; Delay effects; Inductance; Sulfur hexafluoride; Thermal resistance; Thermal stresses; Transient analysis;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1983.5518961