Title :
Diagnosis and correction of multiple logic design errors in digital circuits
Author :
Chung, Pi-Yu ; Haj, Ibrahim N.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
This paper presents a technique to correct multiple logic design errors in a gate-level netlist. A number of methods have been proposed for correcting single logic design errors. However, the extension of these methods to more than one error is still very limited. We direct our attention to circuits with a low multiplicity of errors. By assuming different error dependency scenarios, multiple errors are corrected by repeatedly applying a single error search and correction algorithm. Experimental results on correcting double-design errors and triple-design errors on ISCAS and MCNC benchmark circuits are included.
Keywords :
VLSI; digital integrated circuits; error correction; fault diagnosis; integrated circuit design; integrated logic circuits; logic CAD; logic design; logic testing; digital circuits; double-design errors; error correction; error diagnosis; error search/correction algorithm; gate-level netlist; multiple logic design errors; triple-design errors; Boolean functions; Circuit synthesis; Circuit testing; Debugging; Digital circuits; Error correction; Logic design; Process design; Timing; Very large scale integration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on