• DocumentCode
    1546736
  • Title

    Diagnosis and correction of multiple logic design errors in digital circuits

  • Author

    Chung, Pi-Yu ; Haj, Ibrahim N.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    237
  • Abstract
    This paper presents a technique to correct multiple logic design errors in a gate-level netlist. A number of methods have been proposed for correcting single logic design errors. However, the extension of these methods to more than one error is still very limited. We direct our attention to circuits with a low multiplicity of errors. By assuming different error dependency scenarios, multiple errors are corrected by repeatedly applying a single error search and correction algorithm. Experimental results on correcting double-design errors and triple-design errors on ISCAS and MCNC benchmark circuits are included.
  • Keywords
    VLSI; digital integrated circuits; error correction; fault diagnosis; integrated circuit design; integrated logic circuits; logic CAD; logic design; logic testing; digital circuits; double-design errors; error correction; error diagnosis; error search/correction algorithm; gate-level netlist; multiple logic design errors; triple-design errors; Boolean functions; Circuit synthesis; Circuit testing; Debugging; Digital circuits; Error correction; Logic design; Process design; Timing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.585227
  • Filename
    585227