Author :
Brates, Nanu ; Benenson, David M.
Author_Institution :
State University of New York at Buffalo, Amherst, NY
fDate :
7/1/1983 12:00:00 AM
Keywords :
Coaxial cables; Copper; Electrodes; Interrupters; Optical films; Optical refraction; Plasma temperature; Temperature distribution; Temperature sensors; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1983.5518966
