New theoretical analysis of the LRRM calibration technique for vector network analyzers

Author

Purroy, Francesc ; Pradell, Lluís

Author_Institution

Ericsson Radio Access AB, Stockholm, Sweden

Volume

50

Issue

5

fYear

2001

fDate

10/1/2001 12:00:00 AM

Firstpage

1307

Lastpage

1314

Abstract

In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to which the LRRM calibration is referred) cannot generally be defined whenever nonideal standards are used. Based on this consideration, a new algorithm to determine the on-wafer match standard is proposed that improves the LRRM calibration accuracy. Experimental verification of the new theory and algorithm using on-wafer calibrations up to 40 GHz is given

Keywords

calibration; impedance matching; measurement errors; measurement standards; microwave reflectometry; network analysers; 40 GHz; calibration accuracy; calibration algorithm; error model; four-standards line-reflect-reflect-match calibration; on-wafer calibrations; on-wafer match standard; reference impedance; reference-impedance; reflection coefficient magnitude; self-calibration; systematic errors; vector network-analyzer calibration; Calibration; Circuits; Error analysis; Impedance; Inductance; Measurement standards; Redundancy; Reflection; Resistors; Standards development;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.963202

Filename

963202