• DocumentCode
    1546819
  • Title

    Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide

  • Author

    Abbas, Zulkifly ; Pollard, Roger D. ; Kelsall, Robert W.

  • Author_Institution
    Phys. Dept., Universiti Putra Malaysia, Serdang, Malaysia
  • Volume
    50
  • Issue
    5
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1334
  • Lastpage
    1342
  • Abstract
    The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured sample thickness is presented
  • Keywords
    dielectric loss measurement; dielectric waveguides; microwave measurement; permittivity measurement; rectangular waveguides; Ka-band; complex permittivity measurement; dielectric constant; dielectric loss tangent; effective refractive index; optimization method; rectangular dielectric waveguide; thickness measurement uncertainty; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Measurement uncertainty; Optimization methods; Permittivity measurement; Q measurement; Rectangular waveguides; Refractive index;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.963207
  • Filename
    963207