Scanning force microscope cantilever for voltage sampling with ultrafast time resolution

A scanning force microscopy (SFM) cantilever for the investigation of ultrafast signals is presented. High temporal resolution is achieved by integrating a photoconductive switch within a coplanar waveguide structure onto a low temperature GaAs-GaAs cantilever. Experimental results and numerical calculations of the detection of picosecond guided electrical signals based on the optoelectronic technique of photoconductive sampling are presented.