Title :
Monolithic magnetic Hall sensor using dynamic quadrature offset cancellation
Author :
Bilotti, Alberto ; Monreal, Gerardo ; Vig, Ravi
Author_Institution :
Electron. Bilotti, Olivos, Argentina
fDate :
6/1/1997 12:00:00 AM
Abstract :
The offset voltage and its temperature drift and production spread, which generally degrades the zero-level stability and reproducibility of magnetic Hall sensors, can be reduced using a single Hall plate and switching means for periodic permutation of the supply and output contact pairs. The present work describes a chopper-based 5-V monolithic linear Hall sensor with a ±0.1 T full scale where this dynamic plate offset cancellation technique has been employed together with a cost-effective signal conditioner. The device was integrated using a 2-μm conventional BiCMOS process and the final chip, measuring 15×1.5 mm2, shows, after packaging in a 3-pin plastic package, a residual offset with a production spread and a temperature-induced drift five to ten times smaller than in currently used multiplate dc quadrature cancellation approaches. The device does not require external components and provides an output free of HF residues
Keywords :
BiCMOS analogue integrated circuits; Hall effect transducers; analogue processing circuits; choppers (circuits); circuit stability; integrated circuit measurement; magnetic sensors; signal processing equipment; 2 mum; 3-pin plastic package; 5 V; BiCMOS process; HF residue free output; chopper-based monolithic linear Hall sensor; cost-effective signal conditioner; dynamic plate offset cancellation technique; dynamic quadrature offset cancellation; monolithic magnetic Hall sensor; offset voltage; periodic permutation; reproducibility; residual offset; single Hall plate; temperature drift; zero-level stability; Degradation; Magnetic sensors; Magnetic switching; Plastic packaging; Production; Reproducibility of results; Sensor phenomena and characterization; Stability; Temperature sensors; Zero voltage switching;
Journal_Title :
Solid-State Circuits, IEEE Journal of