Author :
Burns, John J. ; Levine, Bernard ; Dies, Douglas ; Dwon, Larry ; Van Valkenburg, M.K. ; Glover, D.W. ; Morison, D.P.
Author_Institution :
President Solid State Testing, Inc. Burlington, Mass.
Abstract :
Readers are invited to comment in this department on material previously published in IEEE Spectrum; on the policies and operations of the IEEE; and on technical, economic, or social matters of interest to the electrical and electronics engineering profession. Short, concise letters are preferred. The Editor reserves the right to limit debate on controversial issues.
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1977.6501549
