• DocumentCode
    1547255
  • Title

    In-situ monitoring during PLD of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// using RHEED at high oxygen pressure

  • Author

    Rijnders, G.J.H.M. ; Koster, G. ; Blank, D.H.A. ; Rogalla, H.

  • Author_Institution
    Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    1547
  • Lastpage
    1550
  • Abstract
    The surface morphology and initial growth of YBa/sub 2/Cu/sub 3/O/sub u-/spl delta//, using Pulsed Laser Deposition (PLD), have been subject to in many studies. Both, Scanning Probe Microscopy (SPM) as well as Reflection High Energy Electron Diffraction (RHEED) have been applied. The latter is mostly operated using modified deposition parameters, like a reduced oxygen pressure. Here, we have studied the initial growth using a PLD-RHEED system at standard PLD pressures. In this system, in-situ RHEED can be applied in a background pressure of oxygen up to 50 Pa. The initial growth of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// on SrTiO/sub 3/ substrates is studied. The influence of the substrate termination, i.e., SrO or TiO/sub 2/, on the growth will be discussed.
  • Keywords
    barium compounds; high-temperature superconductors; pulsed laser deposition; reflection high energy electron diffraction; superconducting thin films; surface composition; surface topography; yttrium compounds; RHEED; SrTiO/sub 3/; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/; high temperature superconductor; initial growth; modified deposition parameters; pulsed laser deposition; substrate termination; surface morphology; Diffraction; Electrons; Monitoring; Optical pulses; Optical reflection; Oxygen; Pulsed laser deposition; Scanning probe microscopy; Substrates; Surface morphology;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.784689
  • Filename
    784689