DocumentCode
1547255
Title
In-situ monitoring during PLD of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// using RHEED at high oxygen pressure
Author
Rijnders, G.J.H.M. ; Koster, G. ; Blank, D.H.A. ; Rogalla, H.
Author_Institution
Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
1547
Lastpage
1550
Abstract
The surface morphology and initial growth of YBa/sub 2/Cu/sub 3/O/sub u-/spl delta//, using Pulsed Laser Deposition (PLD), have been subject to in many studies. Both, Scanning Probe Microscopy (SPM) as well as Reflection High Energy Electron Diffraction (RHEED) have been applied. The latter is mostly operated using modified deposition parameters, like a reduced oxygen pressure. Here, we have studied the initial growth using a PLD-RHEED system at standard PLD pressures. In this system, in-situ RHEED can be applied in a background pressure of oxygen up to 50 Pa. The initial growth of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// on SrTiO/sub 3/ substrates is studied. The influence of the substrate termination, i.e., SrO or TiO/sub 2/, on the growth will be discussed.
Keywords
barium compounds; high-temperature superconductors; pulsed laser deposition; reflection high energy electron diffraction; superconducting thin films; surface composition; surface topography; yttrium compounds; RHEED; SrTiO/sub 3/; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/; high temperature superconductor; initial growth; modified deposition parameters; pulsed laser deposition; substrate termination; surface morphology; Diffraction; Electrons; Monitoring; Optical pulses; Optical reflection; Oxygen; Pulsed laser deposition; Scanning probe microscopy; Substrates; Surface morphology;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.784689
Filename
784689
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