DocumentCode :
1547394
Title :
Characterization of liquid phase epitaxy grown YBa/sub 2/Cu/sub 3/O/sub 7-x/ thick films as superconductive substrates
Author :
Tanaka, N. ; Hashimoto, K. ; Zama, H. ; Miura, S. ; Morishita, T. ; Yamamoto, H.
Author_Institution :
Supercond. Res. Lab., ISTEC, Tokyo, Japan
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
1634
Lastpage :
1637
Abstract :
The liquid phase epitaxy (LPE) grown YBa/sub 2/Cu/sub 3/O/sub x/ (YBCO) thick films are characterized as a superconductive substrate in comparison with bulk YBCO single crystal substrates. We have focused on the study of the chemical treatments improving the [001] YBCO surface which is mechanically polished. The reaction of the YBCO surface with the HCl/absolute methanol solution is effective for removing damaged remnants on the surface without roughening. Resulting surfaces are precisely examined by observations of atomic force microscopy. The topographical image and its line profile have confirmed that [001] YBCO surfaces are terminated by a unique atomic layer. The chemical stability is also examined under the conditions that additional depositions are followed to form a multilayer structure for devices.
Keywords :
atomic force microscopy; barium compounds; high-temperature superconductors; liquid phase epitaxial growth; polishing; substrates; superconducting epitaxial layers; surface topography; yttrium compounds; AFM; LPE; YBa/sub 2/Cu/sub 3/O/sub 7-x/ thick films; YBa/sub 2/Cu/sub 3/O/sub 7/; atomic force microscopy; chemical stability; chemical treatments; damaged remnants; high temperature superconductors; liquid phase epitaxy; mechanically polished surface; superconductive substrates; topographical image; Atomic force microscopy; Atomic layer deposition; Chemicals; Epitaxial growth; Rough surfaces; Substrates; Surface roughness; Surface topography; Surface treatment; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784735
Filename :
784735
Link To Document :
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