Title :
Power-driven technology mapping using pattern-oriented power modelling
Author :
Yeh, C. ; Chang, C.-C. ; Wang, J.S.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. Chung-Cheng, Chiayi, Taiwan
fDate :
3/1/1999 12:00:00 AM
Abstract :
Power consumption has become a great concern for IC and system designs. As a consequence, power-driven technology mapping has attracted several pieces of research. However, the power model they used cannot properly capture the power dissipation when the output of a gate does not switch. The authors propose a pattern-oriented power modelling for improved technology mapping. We first perform a profitability study using the complete pattern to pattern transition data organised in tabular form. They then put forward a probability-based, pattern-oriented technology mapping method. Empirical results on benchmark circuits demonstrate that the proposed method delivered an average of 13% power reduction compared with the traditional mapping method
Keywords :
circuit CAD; integrated circuit design; power consumption; benchmark circuits; pattern-oriented; power modelling; power-driven technology mapping; profitability study;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings -
DOI :
10.1049/ip-cdt:19990199