• DocumentCode
    1547745
  • Title

    Learning efficiency of redundant neural networks in Bayesian estimation

  • Author

    Watanabe, Sumio

  • Author_Institution
    Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
  • Volume
    12
  • Issue
    6
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    1475
  • Lastpage
    1486
  • Abstract
    This paper proves that the Bayesian stochastic complexity of a layered neural network is asymptotically smaller than that of a regular statistical model if it contains the true distribution. We consider a case when a three-layer perceptron with M input units, H hidden units and N output units is trained to estimate the true distribution represented by the model with H0 hidden units and prove that the stochastic complexity is asymptotically smaller than (1/2) {H0 (M+N)+R} log n where n is the number of training samples and R is a function of H-H0, M, and N that is far smaller than the number of redundant parameters. Since the generalization error of Bayesian estimation is equal to the increase of stochastic complexity, it is smaller than (1/2 n) {H0 (M+N)+R} if it has an asymptotic expansion. Based on the results, the difference between layered neural networks and regular statistical models is discussed from the statistical point of view
  • Keywords
    Bayes methods; function approximation; generalisation (artificial intelligence); learning (artificial intelligence); multilayer perceptrons; probability; Bayesian learning; Kullback information; free energy; function approximation; generalization error; multilayer perceptron; nonidentifiable model; probability; redundant neural networks; statistical model; Artificial neural networks; Bayesian methods; Intelligent networks; Machine learning; Maximum likelihood estimation; Multilayer perceptrons; Neural networks; Probability distribution; State estimation; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/72.963783
  • Filename
    963783