Defect visualization in large area YBCO thin films by magneto-optical scanning technique

Author

Kuhn, M. ; Schey, B. ; Biegel, W. ; Stritzker, B. ; Eisenmenger, J. ; Leiderer, P. ; Heismann, B. ; Kramer, H.-P. ; Neumuller, H.-W.

Author_Institution

Inst. fur Phys., Augsburg Univ., Germany

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

1844

Lastpage

1847

Abstract

Flux penetration in large area YBCO thin films has been studied by a magneto-optical scanning technique. With a new apparatus HTS films as large as 20 cm/spl times/20 cm can be investigated by scanning the films through an inhomogeneous magnetic field. The apparatus has been built to realize an effective homogeneity control of the electrical properties of large area HTS thin films used for device fabrication. Magnetic flux penetration into YBCO thin films of different sizes and with intrinsic defects as well as artificial ones have been studied at 50 K. Magneto-optical measurements are compared with optical microscopy (OM) and inductive j/sub c/-characterizations. A correlation between the kind of defect and its influence on the electrical properties has been studied with regard to device applications, YBCO films structured especially for high current applications were investigated magneto-optically. These results will be compared to optical photographs of the quenching process caused by currents I>I/sub c/.

Keywords

barium compounds; critical current density (superconductivity); crystal defects; high-temperature superconductors; magneto-optical effects; penetration depth (superconductivity); superconducting thin films; yttrium compounds; 20 cm; 50 K; YBa/sub 2/Cu/sub 3/O/sub 7/; defect visualization; effective homogeneity control; electrical properties; flux penetration; high temperature superconductor; large area YBCO thin films; magneto-optical scanning technique; quenching process; High temperature superconductors; Magnetic films; Magnetooptic devices; Magnetooptic effects; Nonuniform electric fields; Optical films; Optical microscopy; Transistors; Visualization; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.784816

Filename

784816