• DocumentCode
    1547885
  • Title

    Impedance boundary condition simulation in the FDTD/FVTD hybrid

  • Author

    Yee, Kane S. ; Chen, Jei S.

  • Author_Institution
    Lockheed Palo Alto Res. Lab., CA, USA
  • Volume
    45
  • Issue
    6
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    921
  • Lastpage
    925
  • Abstract
    The simulation of the impedance boundary condition (IBC) for the finite-difference time-domain (FDTD) and the finite-volume time domain (FVTD) hybrid algorithm with overlapping grids is explained in detail. This paper does not discuss the validity of the IBC model, and our model assumes the surface impedance or surface admittance has a constant resistive part and a nonnegative imaginary part, which is a linear function of frequency. This model is restrictive. But, with this assumption, the use of a convolution integral is avoided and for many applications this is sufficient. Comparisons of the calculations, based on our time-domain algorithm with the Mie series solutions and the method of moment (MoM) solutions, are given. The agreement between our solutions and the referenced solutions shows that our IBC simulation gives credible numerical results
  • Keywords
    digital simulation; electric impedance; electromagnetic field theory; finite difference time-domain analysis; simulation; EM fields; FDTD/FVTD hybrid; Mie series solutions; MoM solution; constant resistive part; finite difference time domain; finite volume time domain; frequency; impedance boundary condition simulation; linear function; method of moment solution; nonnegative imaginary part; sphere; surface admittance; surface impedance; time-domain algorithm; Admittance; Boundary conditions; Convolution; Electromagnetic scattering; Finite difference methods; Frequency dependence; Moment methods; Numerical simulation; Surface impedance; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.585738
  • Filename
    585738