• DocumentCode
    1548312
  • Title

    Evaluation of microwave complex conductivities of YBCO thin films by weakly coupled grain model

  • Author

    Yoshida, K. ; Nishioka, S. ; Morita, H. ; Kanda, Y. ; Shimakage, H. ; Wang, Z.

  • Author_Institution
    Dept. of Electr. Device Eng., Kyushu Univ., Fukuoka, Japan
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    2129
  • Lastpage
    2132
  • Abstract
    A self consistent method for evaluating the complex conductivities of high Tc superconducting Y-Ba-Cu-O(YBCO) thin films has been studied using the coplanar waveguide resonator technique. In order to evaluate the magnetic penetration depth precisely, we measured the temperature dependence of the resonant frequency and compared it with the numerical results self consistently. In the present experiments the observed temperature dependence of the complex conductivities is shown to be able to distinguish the effects of the weaklink from the intrinsic property of the grain of an epitaxial thin film and demonstrate the weakly coupled grain model of YBCO thin films.
  • Keywords
    SCF calculations; barium compounds; ceramics; coplanar waveguides; grain size; high-temperature superconductors; materials testing; microwave measurement; penetration depth (superconductivity); superconducting epitaxial layers; yttrium compounds; Y-Ba-Cu-O; YBCO thin films; complex conductivities; coplanar waveguide resonator technique; epitaxial thin film; high Tc superconducting Y-Ba-Cu-O thin films; magnetic penetration depth; microwave complex conductivities; self consistent method; weakly coupled grain model; Conductivity; Coplanar waveguides; Frequency measurement; High temperature superconductors; Magnetic resonance; Superconducting magnets; Superconducting thin films; Temperature dependence; Transistors; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.784888
  • Filename
    784888