• DocumentCode
    1548661
  • Title

    A Rigorous Classical Solution for the Drain Current of Doped Symmetric Double-Gate MOSFETs

  • Author

    Ortiz-Conde, Adelmo ; García-Sánchez, Francisco J.

  • Author_Institution
    Solid State Electronics Laboratory, Universidad Simón Bolívar, Caracas, Venezuela
  • Volume
    59
  • Issue
    9
  • fYear
    2012
  • Firstpage
    2390
  • Lastpage
    2395
  • Abstract
    We propose a new classical physics rigorous description of the drain current of long channel symmetric double-gate MOSFET with a doped body based on a single integral equation. Whereas existing descriptions are valid for limited ranges of doping concentrations, the equation presented here is valid for any doping concentration, including the so-called intrinsic body case. The description is based on a simple procedure to calculate the surface potential continuously from accumulation to inversion.
  • Keywords
    Approximation methods; Electric potential; MOSFETs; Mathematical model; Semiconductor process modeling; Doped body; SOI MOSFET; generic MOSFET modeling; symmetric double-gate (DG) MOSFET; undoped body;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2204061
  • Filename
    6226450