DocumentCode :
1548661
Title :
A Rigorous Classical Solution for the Drain Current of Doped Symmetric Double-Gate MOSFETs
Author :
Ortiz-Conde, Adelmo ; García-Sánchez, Francisco J.
Author_Institution :
Solid State Electronics Laboratory, Universidad Simón Bolívar, Caracas, Venezuela
Volume :
59
Issue :
9
fYear :
2012
Firstpage :
2390
Lastpage :
2395
Abstract :
We propose a new classical physics rigorous description of the drain current of long channel symmetric double-gate MOSFET with a doped body based on a single integral equation. Whereas existing descriptions are valid for limited ranges of doping concentrations, the equation presented here is valid for any doping concentration, including the so-called intrinsic body case. The description is based on a simple procedure to calculate the surface potential continuously from accumulation to inversion.
Keywords :
Approximation methods; Electric potential; MOSFETs; Mathematical model; Semiconductor process modeling; Doped body; SOI MOSFET; generic MOSFET modeling; symmetric double-gate (DG) MOSFET; undoped body;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2204061
Filename :
6226450
Link To Document :
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