Title :
Synthesis and microwave properties of thin films of the 1:2:2:1 borocarbide superconductors YNiBC and ErNiBC
Author :
Andreone, A. ; Aruta, C. ; Iavarone, M. ; Palomba, F. ; Russo, M.L. ; Salluzzo, M. ; Vaglio, R. ; Cassinese, A. ; Hein, M.A. ; Kaiser, T. ; Mueller, G. ; Perpeet, M.
Author_Institution :
Dipt. di Sci. Fisiche, Napoli Univ., Italy
fDate :
6/1/1999 12:00:00 AM
Abstract :
High-quality c-axis oriented YNi/sub 2/B/sub 2/C (transition temperature T/sub c/=15 K) and ErNi/sub 2/B/sub 2/C (T/sub c/=9.5 K) borocarbide superconducting thin films were grown "in-situ" on MgO and sapphire substrates by planar magnetron sputtering. Here we report data on the temperature, DC and RF magnetic field dependent surface impedance of the films and discuss them in view of possible applications. The YNi/sub 2/B/sub 2/C films displayed the behavior expected for BCS-like superconductors, while the microwave response of the antiferromagnetically ordering compound ErNi/sub 2/B/sub 2/C was distinctly different. The field dependent surface resistance of both types of films displayed granular effects.
Keywords :
erbium compounds; high-frequency effects; nickel compounds; sputter deposition; superconducting thin films; superconducting transition temperature; surface conductivity; yttrium compounds; 15 K; 9.5 K; Al/sub 2/O/sub 3/; BCS-like superconductors; DC magnetic field dependence; ErNi/sub 2/B/sub 2/C; MgO; MgO substrate; RF magnetic field dependence; YNi/sub 2/B/sub 2/C; antiferromagnetically ordering compound; borocarbide superconductors; c-axis oriented thin film; granular effects; microwave properties; microwave response; planar magnetron sputtering; sapphire substrate; superconducting thin film; surface impedance; synthesis; temperature dependence; transition temperature; Magnetic films; Radio frequency; Sputtering; Superconducting films; Superconducting magnets; Superconducting thin films; Superconducting transition temperature; Surface resistance; Temperature dependence; Transistors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on