DocumentCode :
1548758
Title :
Nb/sub 3/Sn films on sapphire. A promising alternative for superconductive microwave technology
Author :
Perpeet, M. ; Cassinese, A. ; Hein, M.A. ; Kaiser, T. ; Muller, G. ; Piel, H. ; Pouryamout, J.
Author_Institution :
Fachbereich Phys., Bergische Univ., Wuppertal, Germany
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
2496
Lastpage :
2499
Abstract :
Phase-pure, large grained Nb/sub 3/Sn films on sapphire substrates have been prepared by a two-step process. The average grain size increased with the film thickness. Transport properties like the penetration depth, mean free path, and critical current density have been investigated in relation to the microstructure of the films. Measurements of the DC- and HF-magnetic field dependent surface impedance were performed. Nonlinear surface resistance occurred at field levels above B/sub s/=25 mT, and was related to extrinsic mechanisms. The relevance of weak coupling at grain boundaries decreased with increasing grain size. Thus heating at local defects was concluded to be the dominant limiting mechanism in large grained films. An intrinsic field limit of B/sub cl/=140 mT was found. The polycrystalline films showed a much lower residual resistance and comparable power handling compared to high-quality epitaxial YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//-films.
Keywords :
critical current density (superconductivity); crystal microstructure; electric impedance; grain boundaries; grain size; niobium alloys; penetration depth (superconductivity); sapphire; substrates; superconducting microwave devices; superconducting thin films; surface conductivity; tin alloys; type II superconductors; Al/sub 2/O/sub 3/; DC-magnetic field dependent surface impedance; HF-magnetic field dependent surface impedance; Nb/sub 3/Sn; average grain size; critical current density; extrinsic mechanisms; film thickness; grain boundaries; intrinsic field limit; large grained Nb/sub 3/Sn films; large grained films; limiting mechanism; local defects; mean free path; microstructure; nonlinear surface resistance; penetration depth; polycrystalline films; power handling; residual resistance; sapphire substrates; superconductive microwave technology; transport properties; two-step process; weak coupling; Critical current density; Electrical resistance measurement; Grain size; Impedance measurement; Microstructure; Niobium; Substrates; Surface impedance; Surface resistance; Tin;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784987
Filename :
784987
Link To Document :
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