Title :
Determination of vortex motion characteristics, effective thickness and dynamic resistance in very thin YBaCuO bilayer structures
Author :
Pannetier, M. ; Bernstein, P. ; Lecoeur, P. ; Riou, O. ; Doan, T.D. ; Hamet, J.F.
Author_Institution :
Site Univ. de Cherbourg, Octeville, France
fDate :
6/1/1999 12:00:00 AM
Abstract :
In order to develop superconducting flux flow devices, we have measured the electrical characteristics of microbridges made from bilayers comprised of a conductive capping layer deposited on a very thin YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// film. In the flux creep regime, these structures show a low and quasi-constant depinning-to-critical current ratio and a high maximum vortex velocity. As expected from these features, the microbridges can be driven in the flux flow regime in the vicinity of T/sub c/. In the flux flow regime, surprisingly, the dynamic resistance is not an increasing function of temperature and shows a value which is in the range of the normal-state resistance at the onset of the superconductive transition.
Keywords :
barium compounds; critical currents; flux creep; flux flow; high-temperature superconductors; superconducting microbridges; superconducting thin films; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7/; conductive capping layer; critical current; dynamic resistance; effective thickness; flux creep; flux flow; flux flow devices; microbridges; superconductive transition; thin YBaCuO bilayer structures; vortex motion; vortex velocity; Conductive films; Conductivity measurement; Creep; Electric variables; Electric variables measurement; Fluid flow measurement; Superconducting devices; Superconducting epitaxial layers; Superconducting films; Superconducting transition temperature;
Journal_Title :
Applied Superconductivity, IEEE Transactions on