Title :
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection
Author :
Pachito, J. ; Martins, C.V. ; Vazquez, Juan Carlos ; Jacinto, Bruno ; Teixeira, I.C. ; Teixeira, J.P. ; Champac, Victor ; Semiao, J. ; Santos, M.B.
Abstract :
This paper presents a methodology to use global and local performance sensors, allowing the circuits to be optimized for power and/or performance.
Keywords :
ageing; circuit optimisation; circuit tuning; fault diagnosis; negative bias temperature instability; aging-aware power; circuit optimization; frequency tuning; global performance sensors; local performance sensors; predictive fault detection; Aging; Degradation; Delays; Integrated circuit modeling; Monitoring; Propagation delay; Sensors; Aging prediction; Dynamic Voltage Frequency Scaling (DVFS); Frequency and Power optimization; Performance sensor;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2012.2206009
