An integrated analog/digital random noise source

Author

Holman, W. Timothy ; Connelly, J.Alvin ; Dowlatabadi, Ahmad B.

Author_Institution

Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA

Volume

44

Issue

6

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

521

Lastpage

528

Abstract

An integrated noise source (INS) has been fabricated in a standard 1.2 μm digital CMOS technology. Wideband white noise is generated from the amplified thermal noise of large resistors, which in turn is coupled into a comparator to generate a random digital bit stream. The INS generates 100 mV rms of analog output noise over a bandwidth of 3.2 MHz and operates from a single 5 V power supply with a quiescent current of 7.4 mA. The circuit has an area of 2.92 mm². Potential applications of the INS include data encryption, mathematical simulation, and circuit test and measurement

Keywords

CMOS integrated circuits; noise generators; random noise; thermal noise; white noise; 1.2 micron; 100 mV; 3.2 MHz; 5 V; 7.4 mA; CMOS technology; amplified thermal noise; analog/digital random noise; circuit testing; comparator; data encryption; integrated noise source; mathematical simulation; resistor; wideband white noise; CMOS technology; Circuit noise; Circuit testing; Coupling circuits; Noise generators; Power generation; Resistors; Thermal resistance; White noise; Wideband;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/81.586025

Filename

586025