Title :
An integrated analog/digital random noise source
Author :
Holman, W. Timothy ; Connelly, J.Alvin ; Dowlatabadi, Ahmad B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
An integrated noise source (INS) has been fabricated in a standard 1.2 μm digital CMOS technology. Wideband white noise is generated from the amplified thermal noise of large resistors, which in turn is coupled into a comparator to generate a random digital bit stream. The INS generates 100 mV rms of analog output noise over a bandwidth of 3.2 MHz and operates from a single 5 V power supply with a quiescent current of 7.4 mA. The circuit has an area of 2.92 mm2. Potential applications of the INS include data encryption, mathematical simulation, and circuit test and measurement
Keywords :
CMOS integrated circuits; noise generators; random noise; thermal noise; white noise; 1.2 micron; 100 mV; 3.2 MHz; 5 V; 7.4 mA; CMOS technology; amplified thermal noise; analog/digital random noise; circuit testing; comparator; data encryption; integrated noise source; mathematical simulation; resistor; wideband white noise; CMOS technology; Circuit noise; Circuit testing; Coupling circuits; Noise generators; Power generation; Resistors; Thermal resistance; White noise; Wideband;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
