DocumentCode :
1549120
Title :
Efficiency improvement of high-pressure microplasma by an electron beam
Author :
Dastgeer, Sheikh ; Lee, Jae Koo ; Kim, Hyun Chul ; Kim, Young Hwan
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
Volume :
29
Issue :
5
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
837
Lastpage :
843
Abstract :
Efficiency has been a paramount issue for the past few years in high pressure microplasma devices such as Plasma Display Panels (PDP). In order to achieve a better efficiency, a novel method based upon electron beam emission has been investigated by a two-dimensional (2-D) fluid simulation. The injection of electron beam inside the PDP cell gives rise to substantially large density of excited Xe species (Xe*), while reducing ionized xenon (Xe+) and electron densities. This, in turn, enhances the efficiency, luminance, and reduces power consumption. The primary reason for generating more Xe* species could be attributed to the formation of low electric field region inside the PDP cell, which consequently improves its operational efficiency. The validity of 2-D fluid simulation results is ensured through a qualitative comparison between the one-dimensional fluid and the kinetic results
Keywords :
discharges (electric); plasma devices; plasma displays; plasma pressure; plasma simulation; plasma-beam interactions; 2-D fluid simulation; Xe; Xe*; Xe+; efficiency improvement; electron beam emission; electron beam injection; electron densities; excited Xe species; high pressure microplasma devices; low electric field region; luminance; one-dimensional fluid; operational efficiency; plasma display panels; power consumption; two-dimensional fluid simulation; Discharges; Electron beams; Energy consumption; Kinetic theory; Particle beams; Plasma displays; Plasma simulation; TV; Two dimensional displays; Xenon;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.964484
Filename :
964484
Link To Document :
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