Measurement of contact resistance with microampere currents

Author

Yoshida, Hiromichi ; Takahashi, Koutaro

Author_Institution

Electron Dept., Tokyo Metropolitan Ind. Center, Tokyo, Japan

Volume

39

Issue

5

fYear

1990

fDate

10/1/1990 12:00:00 AM

Firstpage

711

Lastpage

714

Abstract

The design of an instrument for measuring contact resistance is presented. The design incorporates photo-isolated synchronous rectification. The noise in this instrument is suppressed to 0.1 nV, and contact resistance can be measured with low currents of 0.1 to 100 μA. Several types of contacts are measured with this low-current instrument. When the contacts are contaminated, they are likely to indicate higher resistance than that measured at milliampere currents with widely used commercial instruments. The instrument is clearly effective and the measurement with microampere currents is important for estimating contact resistance under conditions close to actual use

Keywords

contact resistance; electric resistance measurement; 0.1 to 100 muA; 1 kHz; contact resistance measurement; microampere currents; photo-isolated synchronous rectification; Contact resistance; Current measurement; Detectors; Electrical resistance measurement; Instruments; Noise measurement; Phase detection; Pollution measurement; Switches; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.58612

Filename

58612