DocumentCode
1549413
Title
A new method of modeling three-dimensional MIC/MMIC circuits: the space-spectral domain approach
Author
Wu, Ke ; Vahldieck, Ruediger
Author_Institution
Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
Volume
38
Issue
9
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
1309
Lastpage
1318
Abstract
A new space-spectral domain analysis is developed to characterize arbitrarily shaped, spatial three-dimensional (3-D) discontinuities in microwave integrated circuits (MICs) and monolithic microwave integrated circuits (MMICs). The method is very general and combines the advantages of the spectral-domain analysis (SDA) with that of the one-dimensional method of lines (MOL). The unique combination of the one-dimensional SDA, using a continuous Fourier transformation, with the one-dimensional MOL, using a discrete Fourier transformation, makes it possible to analyze circuit configurations which were difficult or impossible to analyze before. A comparison of data obtained from the space-spectral domain approach (SSDA) and the SDA and measurements for a rectangular patch resonator shows excellent agreement. The new approach is numerically very efficient and can be applied to planar transmission lines on insulating as well as semiconducting substrates with and without open boundaries. Several resonator structures are analyzed to demonstrate the usefulness of this new method
Keywords
MMIC; microwave integrated circuits; resonators; strip line components; waveguide theory; 3D circuits modelling; MMICs; discrete Fourier transformation; microstrip resonators; microwave integrated circuits; open boundaries; planar transmission lines; resonator structures; space-spectral domain approach; Convergence; Distributed parameter circuits; Finite difference methods; Insulation; MMICs; Microwave integrated circuits; Planar transmission lines; Power transmission lines; Shape; Transmission line matrix methods;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.58658
Filename
58658
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