• DocumentCode
    1549420
  • Title

    Absorbing boundary conditions for the finite-element analysis of planar devices

  • Author

    Webb, J.P.

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    38
  • Issue
    9
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    1328
  • Lastpage
    1332
  • Abstract
    The finite-element method is used to determine the scattering matrices of open devices in two dimensions. Microwave and optical devices in which the fields are not confined to a finite region can be analyzed with the finite-element method if special boundary conditions are used to absorb outgoing radiation. The absorbing boundary conditions can be imposed by the addition of two terms to the usual functional for the scalar Helmholtz equation. Universal matrices are introduced to allow the additional terms to be easily assembled, for polynomial orders one through four. Results are given for the impedance of a parallel-plate waveguide radiating into free space and for the scattering parameters of three dielectric slab waveguide devices: a rectangular discontinuity, a feed structure, and a junction
  • Keywords
    S-matrix theory; dielectric waveguides; finite element analysis; waveguide components; waveguide theory; absorb outgoing radiation; absorbing boundary conditions; dielectric slab waveguide devices; feed structure; finite-element analysis; finite-element method; junction; microwave devices; optical devices; parallel-plate waveguide radiating into free space; planar devices; rectangular discontinuity; scalar Helmholtz equation; scattering matrices of open devices; scattering parameters; Boundary conditions; Finite element methods; Microwave devices; Microwave theory and techniques; Optical scattering; Optical waveguides; Rectangular waveguides; Transmission line matrix methods; Waveguide discontinuities; Waveguide junctions;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.58660
  • Filename
    58660