• DocumentCode
    1549533
  • Title

    Base station antenna systems with built-in processing for the reduction of the effects of hardware imperfections

  • Author

    Eskelinen, Pekka ; Eskelinen, Ari ; Eskelinen, Harri

  • Author_Institution
    IDC, Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    16
  • Issue
    11
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    21
  • Lastpage
    25
  • Abstract
    The effects of many mechanical and electrical manufacturing imperfections of antenna arrays can be minimized with an internal pattern database. Such deficiencies are the non-idealities of amplitude and phase characteristics of sub-arrays and active modules. The idea of the suggested method is to store measured pattern characteristics into the antenna\´s internal memory at delivery and later, during operation, to use this data to support, for example, a beam forming algorithm, or just to create a static optimum. Thus, the antenna "knows" its behaviour. This method is both more cost-effective than a fine tuning of the hardware items on the production line, and often, the only choice, if relatively inaccurate sheet metal antennas are considered; but naturally, requires some active RF hardware. Our tests demonstrate S-band patterns within 2 dB or 3° of the theoretical ones if an EPROM database at 1° intervals is used. The improvement of the depth of wanted minima can exceed 12 dB
  • Keywords
    active antenna arrays; antenna radiation patterns; array signal processing; EPROM database; RF hardware; S-band; active module; antenna array; base station antenna system; beam forming algorithm; built-in processing; electrical manufacturing imperfection; internal memory; internal pattern database; mechanical manufacturing imperfection; sheet metal antenna; sub-array; Antenna arrays; Antenna measurements; Base stations; Databases; EPROM; Hardware; Manufacturing; Production; Radio frequency; Testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.965008
  • Filename
    965008