DocumentCode
1549726
Title
Guest Editor´s Introduction: test and product life cycle
Author
Ambler, T. ; Bennetts, B.
Author_Institution
University of Texas at Austin
Volume
16
Issue
3
fYear
1999
Firstpage
20
Lastpage
22
Abstract
Presents the guest editorial for this issue of the publication.
Keywords
Costs; Debugging; Electronic equipment testing; Extrapolation; Fault detection; Life testing; Software testing; Switches; System testing; Time to market;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1999.785823
Filename
785823
Link To Document