Title :
Boundary scan: the Internet of test
Author :
Wondolowski, Mike ; Bennetts, Ben ; Ley, Adam
Author_Institution :
Network Equip. Technol., USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
Boundary scan enables us to reuse tests developed at different design levels and in different life-cycle phases. By facilitating communication between previously isolated areas, built-in boundary scan becomes what the authors call the “Internet of Test”
Keywords :
boundary scan testing; logic testing; boundary scan; built-in boundary scan; life-cycle phases; test reuse; Flip-flops; Hardware; Internet; Isolation technology; Life testing; Logic testing; Pins; Probes; Software testing; System testing;
Journal_Title :
Design & Test of Computers, IEEE
