• DocumentCode
    1549736
  • Title

    Boundary scan: the Internet of test

  • Author

    Wondolowski, Mike ; Bennetts, Ben ; Ley, Adam

  • Author_Institution
    Network Equip. Technol., USA
  • Volume
    16
  • Issue
    3
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    34
  • Lastpage
    43
  • Abstract
    Boundary scan enables us to reuse tests developed at different design levels and in different life-cycle phases. By facilitating communication between previously isolated areas, built-in boundary scan becomes what the authors call the “Internet of Test”
  • Keywords
    boundary scan testing; logic testing; boundary scan; built-in boundary scan; life-cycle phases; test reuse; Flip-flops; Hardware; Internet; Isolation technology; Life testing; Logic testing; Pins; Probes; Software testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.785829
  • Filename
    785829
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1549736