Title :
Unveiling the ISCAS-85 benchmarks: a case study in reverse engineering
Author :
Hansen, Mark C. ; Yalcin, Hakan ; Hayes, John P.
Author_Institution :
Delphi Delco Electron Syst., Kokomo, IN, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
Designing at higher levels of abstraction is key to managing the complexity of today´s VLSI chips. The authors show how they reverse-engineered the ISCAS-85 benchmarks to add a useful, new high-level tool to the designer´s arsenal
Keywords :
VLSI; circuit CAD; performance evaluation; reverse engineering; ISCAS-85 benchmarks; VLSI chips; high-level tool; reverse engineering; Adders; Benchmark testing; Circuit synthesis; Circuit testing; Data mining; Engineering management; Hardware design languages; Logic circuits; Logic testing; Reverse engineering;
Journal_Title :
Design & Test of Computers, IEEE
