DocumentCode
1549769
Title
RF integration into CMOS and deep-submicron challenges
Volume
16
Issue
3
fYear
1999
Firstpage
112
Lastpage
116
Keywords
Automatic testing; CMOS logic circuits; CMOS process; CMOS technology; Circuit testing; Design automation; Integrated circuit modeling; Logic testing; MOSFET circuits; Radio frequency;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1999.785846
Filename
785846
Link To Document