DocumentCode :
1549769
Title :
RF integration into CMOS and deep-submicron challenges
Volume :
16
Issue :
3
fYear :
1999
Firstpage :
112
Lastpage :
116
Keywords :
Automatic testing; CMOS logic circuits; CMOS process; CMOS technology; Circuit testing; Design automation; Integrated circuit modeling; Logic testing; MOSFET circuits; Radio frequency;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1999.785846
Filename :
785846
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1549769
