Title :
A 5-MHz 91% Peak-Power-Efficiency Buck Regulator With Auto-Selectable Peak- and Valley-Current Control
Author :
Du, Mengmeng ; Lee, Hoi ; Liu, Jin
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
This paper presents a multi-MHz buck regulator for portable applications using an auto-selectable peak- and valley-current control (ASPVCC) scheme. The proposed ASPVCC scheme can enable the current-mode buck regulator to reduce the settling-time requirement of the current sensing by two times. In addition, the dynamically biased shunt feedback technique is employed to improve the sensing speed and the sensing accuracy of both the peak and valley current sensors. With both ASPVCC scheme and advanced current sensors, the buck regulator can thus operate at high switching frequencies with a wide range of duty ratios for reducing the required off-chip inductance. The proposed current-mode buck regulator was fabricated in a standard 0.35-μm CMOS process and occupies a small chip area of 0.54 mm2. Measurement results show that the buck regulator can deliver a maximum output current of 500 mA, operate at 5 MHz with a wide duty-ratio range of about 0.6, use a small-value off-chip inductor of 1 μH, and achieve the peak power efficiency of 91%.
Keywords :
CMOS integrated circuits; power electronics; CMOS process; autoselectable peak-and-valley-current control scheme; current sensing; dynamically biased shunt feedback technique; frequency 5 MHz; off-chip inductance; peak-power-efficiency buck regulator; settling-time requirement; size 0.35 mum; small-value off-chip inductor; Clocks; Inductors; Oscillators; Regulators; Sensors; Switching frequency; Voltage control; Buck regulator; current sensor; current-mode control (CMC); dc-dc converter; dynamically biased shunt feedback; on-chip current-sensing circuit; peak-current control; pulsewidth modulation (PWM); subharmonic oscillation; switched-mode power converter; valley-current control;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2151470