DocumentCode
1550103
Title
Terahertz spectroscopy as a new tool for insulating material analysis and condition monitoring
Author
Fuse, Norikazu ; Takahashi, Tsuguhiro ; Ohki, Yoshimichi ; Sato, Ryo ; Mizuno, Maya ; Fukunaga, Kaori
Author_Institution
Electr. Power Eng. Res. Lab., Central Res. Inst. of Electr. Power Ind., Yokosuka, Japan
Volume
27
Issue
3
fYear
2011
Firstpage
26
Lastpage
35
Abstract
Spectroscopic and imaging analyses using electromagnetic waves in the far IR or submillimeter region [0.1-20 terahertz (THz)] are emerging technologies in the field of optics research. Thanks to recent advances in related science and technology [l]-[6], it has been proposed that THz technology be applied in many fields such as early diagnosis of cancer, detection of counterfeit bills, and moisture analysis.
Keywords
condition monitoring; electromagnetic waves; insulating materials; terahertz spectroscopy; terahertz wave imaging; condition monitoring; electromagnetic waves; imaging analyses; insulating material analysis; terahertz spectroscopy; Condition monitoring; Materials processing; Measurement by laser beam; Polyethylene; Spectroscopy; density functional theory; insulating material; internal stress; nondestructive monitoring; polymer nanocomposite; terahertz spectroscopy; time-domain imaging; vibrational mode; water treeing;
fLanguage
English
Journal_Title
Electrical Insulation Magazine, IEEE
Publisher
ieee
ISSN
0883-7554
Type
jour
DOI
10.1109/MEI.2011.5871366
Filename
5871366
Link To Document