DocumentCode
155025
Title
Theorem design of test structures matrix type as systems of recognition of images, events, signs, devices
Author
Zaharov, A.A. ; Tkachenko, I.M. ; Kozhanova, E.R.
Author_Institution
Yuri Gagarin State Tech. Univ. of Saratov, Saratov, Russia
Volume
2
fYear
2014
fDate
25-26 Sept. 2014
Firstpage
149
Lastpage
153
Abstract
Article use this procedure to build composite test matrix structures as pattern recognition systems. The authors presented the theorem transformation test tracks in the expert system. Also see logistic models of such structures.
Keywords
expert systems; image recognition; matrix algebra; composite test matrix structures; devices; events recognition; expert system; images recognition; logistic models; pattern recognition systems; signs recognition; theorem design; theorem transformation test; Control systems; Educational institutions; Expert systems; Image recognition; Logistics; Pattern recognition; Process control;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4799-3437-9
Type
conf
DOI
10.1109/APEDE.2014.6958233
Filename
6958233
Link To Document