• DocumentCode
    1550498
  • Title

    Temperature compensated sapphire-rutile microwave whispering gallery mode resonator

  • Author

    Kersalé, Y. ; Vallet, O. ; Vives, S. ; Meunier, C. ; Giordano, V.

  • Author_Institution
    Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France
  • Volume
    37
  • Issue
    23
  • fYear
    2001
  • fDate
    11/8/2001 12:00:00 AM
  • Firstpage
    1392
  • Lastpage
    1393
  • Abstract
    A 2 μm-thick film of rutile (TiO2) was deposited on a sapphire disk using a sol-gel method to realise a temperature compensated microwave resonator operating in whispering gallery mode configuration. The resonator, though not yet completely optimised, shows turnover temperatures ranging from 40 to 60 K depending on the mode azimutal number. For the WGH7,0,0 mode at 9.4 GHz, the Q-factor is of the order of 1.5×106 at 46 K. The technique appears easy to implement and can be used for the design of a high-frequency stability microwave source
  • Keywords
    Q-factor; compensation; dielectric resonators; frequency stability; microwave devices; sapphire; titanium compounds; 2 micron; 40 to 60 K; 9.4 GHz; Al2O3; Q-factor; TiO2-Al2O3; high-frequency stability microwave source; rutile film; sapphire disk; sapphire-rutile microwave resonator; sol-gel method; temperature compensated microwave resonator; whispering gallery mode resonator;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20010934
  • Filename
    966542
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1550498