Title :
Design and analysis of single-mode oxidized VCSELs for high-speed optical interconnects
Author :
Wiedenmann, Dieter ; King, Roger ; Jung, Christian ; Jäger, Roland ; Michalzik, Rainer ; Schnitzer, Peter ; Kicherer, Max ; Ebeling, Karl J.
Author_Institution :
dept. of Optoelectron., Ulm Univ., Germany
Abstract :
Oxide-confined vertical-cavity surface-emitting laser diodes (VCSELs) are fabricated for applications in high-performance optical interconnects. Both 980-nm as well as 850-nm wavelength devices in one- and two-dimensional arrays are investigated. Noise properties of single- and multimode devices under different operation conditions are relative intensity noise of single-mode devices can be as low as -150 dB/Hz at output powers of about 1 mW and feedback levels up to -30 dB. Data rates up to 12.5 Gb/s with bit error rates below 10-11 are achieved with VCSELs showing stable single-mode emission at large-signal modulation, combined with modulation bandwidths exceeding 10 GHz. Arrays with 4×8 elements flip-chip mounted on Si CMOS driver chips ready for use in parallel data transmission systems are presented
Keywords :
data communication; electro-optical modulation; flip-chip devices; laser modes; laser noise; laser stability; optical design techniques; optical fabrication; optical interconnections; semiconductor laser arrays; surface emitting lasers; 1 mW; 10 GHz; 12.5 Gbit/s; 850 nm; 980 nm; Si CMOS driver chips; feedback levels; high-performance optical interconnects; high-speed optical interconnects; large-signal modulation; modulation bandwidths; multimode devices; operation conditions; output powers; oxide-confined vertical-cavity surface-emitting laser diodes; parallel data transmission systems; relative intensity noise; single mode devices; single-mode oxidized VCSEL; stable single-mode emission; Bandwidth; Bit error rate; Diode lasers; Noise level; Optical interconnections; Optical noise; Optical surface waves; Output feedback; Power generation; Vertical cavity surface emitting lasers;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.788412
