DocumentCode
1550569
Title
Statistical modeling of transmission line model test structures. I. The effect of inhomogeneities on the extracted contact parameters
Author
Gutai, Laszlo
Author_Institution
Philips Components-Signetics Co., Sunnyvale, CA, USA
Volume
37
Issue
11
fYear
1990
fDate
11/1/1990 12:00:00 AM
Firstpage
2350
Lastpage
2360
Abstract
Extraction of electrical contact parameters by transmission line model (TLM) test structures is based on the assumption that the electrical and geometrical parameters of the contacts within a structure are identical. Statistical modeling is presented to show that the usual extraction procedure can lead to large errors in the extracted contact parameters in the case of nonideal TLM structures, even if there is no error in the measured electrical and geometrical parameters. Errors in the extracted parameters as functions of the nominal contact parameters are presented graphically. These graphs can be used to assess the accuracy of the TLM measurements and to optimize TLM test structure design. In the parameter intervals examined, the TLM method works best (yields the fewest errors in all extracted parameters) when the geometrical length of a contact is equal to about two times the electrical transfer length
Keywords
electrical conductivity measurement; measurement errors; ohmic contacts; semiconductor-metal boundaries; statistical analysis; effect of inhomogeneities; electrical contact parameters extraction; extracted contact parameters; geometrical length of contacts; large errors; nonideal TLM structures; statistical modeling; transmission line model test structures; Conductivity; Contact resistance; Electric resistance; Electrical resistance measurement; Kelvin; Solid modeling; Surface resistance; Testing; Transmission line measurements; Transmission lines;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.62287
Filename
62287
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