DocumentCode :
1550569
Title :
Statistical modeling of transmission line model test structures. I. The effect of inhomogeneities on the extracted contact parameters
Author :
Gutai, Laszlo
Author_Institution :
Philips Components-Signetics Co., Sunnyvale, CA, USA
Volume :
37
Issue :
11
fYear :
1990
fDate :
11/1/1990 12:00:00 AM
Firstpage :
2350
Lastpage :
2360
Abstract :
Extraction of electrical contact parameters by transmission line model (TLM) test structures is based on the assumption that the electrical and geometrical parameters of the contacts within a structure are identical. Statistical modeling is presented to show that the usual extraction procedure can lead to large errors in the extracted contact parameters in the case of nonideal TLM structures, even if there is no error in the measured electrical and geometrical parameters. Errors in the extracted parameters as functions of the nominal contact parameters are presented graphically. These graphs can be used to assess the accuracy of the TLM measurements and to optimize TLM test structure design. In the parameter intervals examined, the TLM method works best (yields the fewest errors in all extracted parameters) when the geometrical length of a contact is equal to about two times the electrical transfer length
Keywords :
electrical conductivity measurement; measurement errors; ohmic contacts; semiconductor-metal boundaries; statistical analysis; effect of inhomogeneities; electrical contact parameters extraction; extracted contact parameters; geometrical length of contacts; large errors; nonideal TLM structures; statistical modeling; transmission line model test structures; Conductivity; Contact resistance; Electric resistance; Electrical resistance measurement; Kelvin; Solid modeling; Surface resistance; Testing; Transmission line measurements; Transmission lines;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.62287
Filename :
62287
Link To Document :
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