Synthesis of microwave and microcontroller equipment for particle size measurement

Author

Akhobadze, G.N.

Author_Institution

V.A. Trapeznikov Inst. of Control Sci., Moscow, Russia

Volume

2

fYear

2014

fDate

25-26 Sept. 2014

Firstpage

310

Lastpage

317

Abstract

The paper discusses problems of particle size measurement on the basis of utilizing microwave and microcontroller equipment. Results of theoretical studies of reflectance properties of dielectric particles and current-conducting ones during electromagnetic-wave sounding of them are presented. Experimental results of particle diameter measurement in relation to electromagnetic oscillation frequency and incidence angle and acceptance one for reflected signals are demonstrated. The feasibility of using an information signal received during the acceptance of a reflected orthogonal-polarization signal is shown. A configuration scheme for microcontroller facilities for particle signal processing is proposed. Recommended practices for designing equipment for particle size measurement are given.

Keywords

microcontrollers; microwave measurement; particle size measurement; reflectivity; signal processing equipment; current-conducting ones; dielectric particles; electromagnetic oscillation frequency; electromagnetic-wave sounding; incidence angle; information signal; microcontroller equipment; microwave equipment; particle diameter measurement; particle size measurement; reflectance properties; reflected orthogonal-polarization signal; reflected signals; Frequency measurement; Microcontrollers; Microwave devices; Microwave measurement; Microwave oscillators; Nickel; Size measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on

Conference_Location

Saratov

Print_ISBN

978-1-4799-3437-9

Type

conf

DOI

10.1109/APEDE.2014.6958268

Filename

6958268