Title :
Reliability improving of test monitoring of complex digital electronic devices
Author :
Svetlov, M.S. ; L´vov, A.A. ; Ulyanina, Yu.A.
Abstract :
In design and development of a monitoring system for digital electronic devices one of the main problems is the synthesis of test pseudorandom sequences (PS) with required features. The analytical estimators of correcting capacity of test PS based on their statistical features are derived in the paper. The results obtained allow one to rise drastically the efficiency and reliability of diagnostic procedures of complex digital devices.
Keywords :
digital circuits; integrated circuit reliability; integrated circuit testing; random sequences; analytical estimators; complex digital electronic devices; diagnostic procedures; statistical features; test monitoring; test pseudorandom sequences; Discharges (electric); Insulation; Interrupters; Monitoring; Presses; Reliability; Switching circuits;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4799-3437-9
DOI :
10.1109/APEDE.2014.6958271
