Title :
Fabrication and performance of AlGaAs-GaAs distributed Bragg reflector lasers and distributed feedback lasers utilizing first-order diffraction gratings formed by a periodic groove structure
Author :
Oku, Satoshi ; Ishii, Tetuyoshi ; Iga, Ryuzo ; Hirono, Takuo
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
Abstract :
Distributed Bragg reflector (DBR) lasers and distributed feedback (DFB) lasers utilizing diffraction grating formed by deeply etched periodic grooves were fabricated on an InGaAs-GaAs-strained quantum-well active wafer without using a regrowth process. The first-order grooved grating that had a 150-nm period and 800-nm depth was etched from the top surface into the cladding layer on the wafer using electron beam lithography and a reactive beam etching with a mixture of Br2 and N2 gas. The dependence of optical properties on the structure of the grooved grating is discussed in terms of an evaluation of the coupling coefficient. The fabricated DBR and DFB lasers exhibit single-longitudinal mode oscillation with output powers of 20 mW (DBR) and 10 mW (DFB) in the measured temperature range between 15°C-55°C. The characteristic temperature T0 for the threshold current is about 120 K. The slope efficiency is held constant in the measured temperature range. The performance of these DBR and DFB lasers demonstrates that the use of the grooved grating provides wavelength-stabilized lasers with a simple fabrication process
Keywords :
Debye temperature; aluminium compounds; diffraction gratings; distributed Bragg reflector lasers; distributed feedback lasers; etching; gallium arsenide; optical fabrication; quantum well lasers; 10 mW; 120 K; 15 to 55 C; 150 nm; 20 mW; 800 nm; AlGaAs-GaAs distributed Bragg reflector lasers; DBR lasers; DFB lasers; InGaAs-GaAs; InGaAs-GaAs-strained quantum-well active wafer; characteristic temperature; cladding layer; coupling coefficient; deeply etched periodic grooves; diffraction grating; distributed feedback lasers; electron beam lithography; first-order diffraction gratings; first-order grooved grating; grooved grating; measured temperature range; optical properties; output powers; periodic groove structure; reactive beam etching; regrowth process; simple fabrication process; single-longitudinal mode oscillation; slope efficiency; temperature range; threshold current; top surface; wavelength-stabilized lasers; Diffraction; Distributed Bragg reflectors; Distributed feedback devices; Etching; Gratings; Laser feedback; Optical device fabrication; Temperature distribution; Temperature measurement; Wavelength measurement;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.788435