• DocumentCode
    1550711
  • Title

    Analysis of transverse modes of nitride-based laser diodes

  • Author

    Onomura, Masaaki ; Saito, Shinji ; Sasanuma, Katsunobu ; Hatakoshi, Gen-ichi ; Nakasuji, Mikio ; Rennie, John ; Sugiura, Lisa ; Nunoue, Shinya ; Nishio, Joji ; Itaya, Kazuhiko

  • Author_Institution
    Adv. Semicond. Device Res. Lab., Toshiba Corp., Kawasaki, Japan
  • Volume
    5
  • Issue
    3
  • fYear
    1999
  • Firstpage
    765
  • Lastpage
    770
  • Abstract
    We investigated the far-field patterns perpendicular to the junction plane under room-temperature current excitation and analyzed the transverse modes of nitride-based laser diodes with various types of AlGaN cladding layers. It was found that nitride-based laser structures with thin AlGaN cladding layers induce leakage of high-order transverse modes to the outer GaN contact layers, even with a relatively high aluminum composition of 15% in the cladding layers. The perpendicular far-field pattern of the lasers with 0.9-μm-thick Al0.07Ga 0.93N cladding layers that nearly coincides with that of the fundamental mode was obtained. From simulation of the maximum optical confinement factor, it was found that the threshold current density decreases as the thickness of the AlGaN cladding layer increases in anti-guide-like laser structures
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; claddings; gallium compounds; indium compounds; laser beams; laser modes; optical fabrication; quantum well lasers; waveguide lasers; 0.9 mum; 298 K; Al0.07Ga0.93N; Al0.07Ga0.93N cladding layers; AlGaN; AlGaN cladding layer; AlGaN cladding layers; GaN; InGaN; InGaN multiple quantum well lasers; InGaN-AlGaN; anti-guide-like laser structures; cladding layers; far-field patterns; fundamental mode; high-order transverse modes; junction plane; maximum optical confinement factor; nitride-based laser diodes; nitride-based laser structures; outer GaN contact layers; perpendicular far-field pattern; room-temperature current excitation; threshold current density; transverse modes; Aluminum gallium nitride; Diode lasers; Gallium nitride; Laser modes; Optical refraction; Optical variables control; Optical waveguides; Quantum well lasers; Semiconductor lasers; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.788449
  • Filename
    788449