Title :
Universal platform for PCB functional testing
Author :
Serban, Mariana ; Vagapov, Yuriy ; Chen, Zhe ; Holme, R. ; Lupin, Sergey
Author_Institution :
Control Tech., Emerson Ind. Autom., Newtown, UK
Abstract :
The paper discusses the development of a cost-effective, universal PCB test platform aimed to minimise test time and expand test coverage. The platform provides the efficient and effective testing of PCBs at the functional level. In contrast to existing functional testing equipment designed for one particular PCB only, the proposed platform is universal and can be easily reconfigured and reprogrammed to test different PCBs. A prototype of the test platform was developed and built using National Instrument hardware and software.
Keywords :
cost reduction; functional analysis; printed circuit design; printed circuit testing; test equipment; PCB design; PCB functional level testing equipment; cost-effective development; national instrument hardware and software; test coverage; test time minimisation; universal platform; Control systems; Hardware; Instruments; Software; Standards; Testing; Voltage measurement;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4799-3437-9
DOI :
10.1109/APEDE.2014.6958285
