Title :
Plastic module of laser diode and photodiode mounted on planar lightwave circuit for access network
Author :
Fukuda, Mitsuo ; Ichikawa, Fumio ; Shuto, Yoshito ; Sato, Hirotsugu ; Yamada, Yasufumi ; Kato, Kuniharu ; Tohno, Shunichi ; Toba, Hiromu ; Sugie, Toshihiko ; Yoshida, Junichi ; Suzuki, Kennichi ; Suzuki, Osamu ; Kondo, Sumio
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
fDate :
9/1/1999 12:00:00 AM
Abstract :
Low-cost plastic packaging of laser diodes and photodiodes mounted on planar lightwave circuit (PLC) platform are developed and its reliability is confirmed under various environmental and endurance tests. The high performance of the module is maintained under reliability tests, such as high-humidity high-temperature tests (85°C, 85%RH) and temperature cycling tests (-40°C/85°C). No laser diodes show any device characteristics change during environmental tests and their stability has very little dependence on current bias. Although the photodiodes show an increase in leakage current under high-temperature high-humidity tests and the rate of leakage current increase is proportional to the square root of bias voltage, the increase is negligible for system use. These plastic modules can be applied to actual access networks and other fiber-optic networks
Keywords :
environmental testing; modules; photodiodes; plastic packaging; semiconductor device reliability; semiconductor device testing; semiconductor lasers; -40 C; 85 C; access network; endurance tests; environmental tests; fiber-optic networks; high-humidity high-temperature tests; high-temperature high-humidity tests; laser diode; low-cost plastic packaging; photodiode; planar lightwave circuit; plastic module; plastic modules; reliability test; Circuit testing; Diode lasers; Laser stability; Leakage current; Maintenance; Photodiodes; Plastic packaging; Programmable control; System testing; Temperature;
Journal_Title :
Lightwave Technology, Journal of
