Stress analysis method considering piezoelectric effects and its application to static strain optic devices

Author

Saitoh, Kunimasa ; Koshiba, Masanori ; Tsuji, Yasuhide

Author_Institution

Dept. of Electron. & Inf. Eng., Hokkaido Univ., Sapporo, Japan

Volume

17

Issue

9

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

1626

Lastpage

1633

Abstract

A stress analysis method considering piezoelectric effects based on the finite-element method (FEM), which can be applied to arbitrarily anisotropic material-based optical waveguide devices, is newly formulated. To produce a two-step analysis of static strain optic (SSO) and electrooptic (EO) modulations of optical waveguide devices, this stress analysis is linked to the guided mode analysis and the beam propagation analysis taking into account the refractive index changes. Numerical examples are shown for strain-induced optical waveguides and strain-induced polarization mode converters on LiNbO₃ substrates

Keywords

electro-optical modulation; finite element analysis; integrated optics; lithium compounds; optical polarisers; optical waveguides; piezoelectricity; stress analysis; FEM; LiNbO₃; LiNbO₃ substrates; arbitrarily anisotropic material-based optical waveguide devices; beam propagation analysis; electrooptic modulation; finite-element method; guided mode analysis; piezoelectric effects; refractive index changes; static strain optic devices; static strain optic modulation; strain-induced optical waveguides; strain-induced polarization mode converters; stress analysis method; two-step analysis; Electrooptical waveguides; Finite element methods; Geometrical optics; Optical devices; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Piezoelectric effect; Stress;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.788568

Filename

788568