Title :
Structural and optical characterisation of holey fibres using scanning probe microscopy
Author :
Hiliman, C.W.J. ; Brocklesby, W.S. ; Monro, T.M. ; Belardi, W. ; Richardson, D.J.
Author_Institution :
Optoelectron. Res. Centre, Southampton Univ., UK
fDate :
10/11/2001 12:00:00 AM
Abstract :
An investigation of a holey fibre using scanning probe microscopy techniques, which the authors believe is the first such investigation, is presented. Atomic force microscopy images provide knowledge of the fibre structure without the artefacts associated with scanning electron microscopy imaging. A tapered fibre scanning near-field optical microscopy probe has been used to investigate holey fibre modes at 785 nm
Keywords :
atomic force microscopy; near-field scanning optical microscopy; optical fibres; 785 nm; atomic force microscopy; holey fibre; optical characteristics; scanning probe microscopy; structural characteristics; tapered fibre scanning near-field optical microscopy probe;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20010874
