Title :
A physically based analytic model of FET Class-E power amplifiers-designing for maximum PAE
Author :
Choi, David K. ; Long, Stephen I.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fDate :
9/1/1999 12:00:00 AM
Abstract :
In this paper, we present a new Class-E power-amplifier model. Through a physically based analysis, our novel approach yields closed-form expressions for input, output, and dc power. These expressions yield the important figures-of-merit [gain, drain efficiency, and power-added efficiency (PAE)]. Using standard device parameters, design optimization for maximum PAE follows directly from the analysis and applies to bath integrated and discrete transistor implementations. For integrated designs, the optimal FET aspect ratio can be determined, given the design variables of the Class-E output network (output power, frequency, supply voltage, and loaded-Q of the output resonator). In a discrete transistor application, the Class-E network can be optimized for one of the design variables. The detrimental effects of the device parasitics on the amplifier´s performance at UHF and microwave frequencies are accounted for in the model and explained in this paper. We verified the validity of the model by comparing our computed values against those from simulations using an optimized 0.5-μm CMOS level-3 SPICE model
Keywords :
CMOS analogue integrated circuits; MMIC power amplifiers; SPICE; UHF integrated circuits; UHF power amplifiers; circuit simulation; field effect MMIC; microwave power amplifiers; 0.5 micron; CMOS; FET Class-E power amplifiers; SPICE model; UHF; closed-form expressions; design variables; device parasitics; discrete transistor application; integrated designs; loaded-Q; maximum PAE; microwave frequencies; output power; physically based analytic model; simulations; Closed-form solution; Design optimization; FETs; Frequency; Microwave transistors; Power amplifiers; Power generation; Power supplies; Semiconductor device modeling; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on