• DocumentCode
    1551343
  • Title

    Surface micromachining of polycrystalline SiC films using microfabricated molds of SiO2 and polysilicon

  • Author

    Yasseen, A. Azzam ; Zorman, Christian A. ; Mehregany, Mehran

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
  • Volume
    8
  • Issue
    3
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    242
  • Abstract
    As an alternative to conventional SiC reactive ion etching (RIE), polycrystalline (poly-SiC) films were patterned into micron-sized structures using sacrificial SiO2 and polycrystalline silicon (polysilicon) molds in conjunction with mechanical polishing. The molds were made from thermally grown SiO2 and LPCVD polysilicon films and were fabricated using conventional patterning techniques. The poly-SiC micromolding process combines film deposition, polishing, and selective wet chemical etching of the molds to achieve the desired pattern. The process is simple and does not suffer from the difficulties associated with RIE of SiC. Micrometer sized lines, spaces, and complex device structures have been patterned using this technique. The micromolding technique has been used in a SiC surface micromachining process to fabricate fully released lateral resonant structures
  • Keywords
    etching; micromachining; moulding; polishing; semiconductor materials; semiconductor thin films; silicon compounds; LPCVD film; MEMS; Si; SiC; SiC polycrystalline film; SiO2; lateral resonant structure; mechanical polishing; microfabrication; micromolding; polysilicon mold; sacrificial SiO2 mold; surface micromachining; thermal oxide; wet chemical etching; Microactuators; Micromachining; Micromechanical devices; Plasma applications; Plasma materials processing; Semiconductor films; Silicon carbide; Substrates; Surface morphology; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.788626
  • Filename
    788626